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 A29L800 Series
1M X 8 Bit / 512K X 16 Bit CMOS 3.0 Volt-only, Preliminary
Features
n Single power supply operation - Full voltage range: 2.7 to 3.6 volt read and write operations for battery-powered applications n Access times: - 70/90 (max.) n Current: - 9 mA typical active read current - 20 mA typical program/erase current - 200 nA typical CMOS standby - 200 nA Automatic Sleep Mode current n Flexible sector architecture - 16 Kbyte/ 8 KbyteX2/ 32 Kbyte/ 64 KbyteX15 sectors - 8 Kword/ 4 KwordX2/ 16 Kword/ 32 KwordX15 sectors - Any combination of sectors can be erased - Supports full chip erase - Sector protection: A hardware method of protecting sectors to prevent any inadvertent program or erase operations within that sector. Temporary Sector Unprotect feature allows code changes in previously locked sectors n Extended operating temperature range: -45C ~ +85C for -U series n Unlock Bypass Program Command - Reduces overall programming time when issuing multiple program command sequence n Top or bottom boot block configurations available n Embedded Algorithms - Embedded Erase algorithm will automatically erase the entire chip or any combination of designated sectors and verify the erased sectors - Embedded Program algorithm automatically writes and verifies data at specified addresses n Typical 100,000 program/erase cycles per sector n 20-year data retention at 125C - Reliable operation for the life of the system n Compatible with JEDEC-standards - Pinout and software compatible with single-powersupply Flash memory standard - Superior inadvertent write protection n Data Polling and toggle bits - Provides a software method of detecting completion of program or erase operations n Ready / BUSY pin (RY / BY ) - Provides a hardware method of detecting completion of program or erase operations (not available on 44pin SOP) n Erase Suspend/Erase Resume - Suspends a sector erase operation to read data from, or program data to, a non-erasing sector, then resumes the erase operation n Hardware reset pin ( RESET ) - Hardware method to reset the device to reading array data n Package options - 44-pin SOP or 48-pin TSOP (I) or 48-ball TFBGA
Boot Sector Flash Memory
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A29L800 Series
General Description
The A29L800 is an 8Mbit, 3.0 volt-only Flash memory organized as 1,048,576 bytes of 8 bits or 524,288 words of 16 bits each. The 8 bits of data appear on I/O0 - I/O7; the 16 bits of data appear on I/O0~I/O15. The A29L800 is offered in 48-ball TFBGA, 44-pin SOP and 48-Pin TSOP packages. This device is designed to be programmed in-system with the standard system 3.0 volt VCC supply. Additional 12.0 volt VPP is not required for in-system write or erase operations. However, the A29L800 can also be programmed in standard EPROM programmers. The A29L800 has the first toggle bit, I/O6, which indicates whether an Embedded Program or Erase is in progress, or it is in the Erase Suspend. Besides the I/O6 toggle bit, the A29L800 has a second toggle bit, I/O2, to indicate whether the addressed sector is being selected for erase. The A29L800 also offers the ability to program in the Erase Suspend mode. The standard A29L800 offers access times of 70 and 90ns, allowing high-speed microprocessors to operate without wait states. To eliminate bus contention the device has separate chip enable ( CE ), write enable ( WE ) and output enable ( OE ) controls. The device requires only a single 3.0 volt power supply for both read and write functions. Internally generated and regulated voltages are provided for the program and erase operations. The A29L800 is entirely software command set compatible with the JEDEC single-power-supply Flash standard. Commands are written to the command register using standard microprocessor write timings. Register contents serve as input to an internal state-machine that controls the erase and programming circuitry. Write cycles also internally latch addresses and data needed for the programming and erase operations. Reading data out of the device is similar to reading from other Flash or EPROM devices. Device programming occurs by writing the proper program command sequence. This initiates the Embedded Program algorithm - an internal algorithm that automatically times the program pulse widths and verifies proper program margin. Device erasure occurs by executing the proper erase command sequence. This initiates the Embedded Erase algorithm - an internal algorithm that automatically preprograms the array (if it is not already programmed) before executing the erase operation. During erase, the device automatically times the erase pulse widths and verifies proper erase margin. The Unlock Bypass mode facilitates faster programming times by requiring only two write cycles to program data instead of four. The host system can detect whether a program or erase operation is complete by observing the RY / BY pin, or by reading the I/O7 ( Data Polling) and I/O6 (toggle) status bits. After a program or erase cycle has been completed, the device is ready to read array data or accept another command. The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The A29L800 is fully erased when shipped from the factory. The hardware sector protection feature disables operations for both program and erase in any combination of the sectors of memory. This can be achieved via programming equipment. The Erase Suspend/Erase Resume feature enables the user to put erase on hold for any period of time to read data from, or program data to, any other sector that is not selected for erasure. True background erase can thus be achieved. The hardware RESET pin terminates any operation in progress and resets the internal state machine to reading array data. The RESET pin may be tied to the system reset circuitry. A system reset would thus also reset the device, enabling the system microprocessor to read the boot-up firmware from the Flash memory. The device offers two power-saving features. When addresses have been stable for a specified amount of time, the device enters the automatic sleep mode. The system can also place the device into the standby mode. Power consumption is greatly reduced in both these modes.
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A29L800 Series
Pin Configurations
n SOP
RY/BY A18 A17 A7 A6 A5 A4 A3 A2 A1 A0 CE VSS OE I/O0 I/O8 I/O1 I/O9 I/O2 I/O10 I/O3 I/O11 1 2 3 4 5 6 7 8 44 43 42 41 40 39 38 37 RESET WE A8 A9 A10 A11 A12 A13 A14 A15 A16 BYTE VSS I/O15 (A-1) I/O7 I/O14 I/O6 I/O13 I/O5 I/O12 I/O4 VCC A15 A14 A13 A12 A11 A10 A9 A8 NC NC WE RESET NC NC RY/BY A18 A17 A7 A6 A5 A4 A3 A2 A1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 A16 BYTE VSS I/O15 (A-1) I/O7 I/O14 I/O6 I/O13 I/O5 I/O12 I/O4 VCC I/O11 I/O3 I/O10 I/O2 I/O9 I/O1 I/O8 I/O0 OE VSS CE A0
n TSOP (I)
10 11 12 13 14 15 16 17 18 19 20 21 22
A29L800
9
36 35 34 33 32 31 30 29 28 27 26 25 24 23
A29L800V
n TFBGA
TFBGA Top View, Balls Facing Down
A6 B6 C6 D6 E6 F6
G6
H6
A13
A5
A12
B5
A14
C5
A15
D5
A16
E5
BYTE
F5
I/O15(A-1)
G5
VSS
H5
A9
A4
A8
B4
A10
C4
A11
D4
I/O7
E4
I/O14
F4
I/O13
G4
I/O6
H4
WE
A3
RESET
B3
NC
C3
NC
D3
I/O5
E3
I/O12
F3
VCC
G3
I/O4
H3
RY/BY
A2
NC
B2
A18
C2
NC
D2
I/O2
E2
I/O10
F2
I/O11
G2
I/O3
H2
A7
A1
A17
B1
A6
C1
A5
D1
I/O0
E1
I/O8
F1
I/O9
G1
I/O1
H1
A3
A4
A2
A1
A0
CE
OE
VSS
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A29L800 Series
Block Diagram
RY/BY VCC VSS I/O0 - I/O 15 (A-1) Sector Switches Erase Voltage Generator State Control PGM Voltage Generator Chip Enable Output Enable Logic STB Data Latch Input/Output Buffers
RESET
WE BYTE
Command Register CE OE
STB VCC Detector Timer Address Latch
Y-Decoder
Y-Gating
A0-A18
X-decoder
Cell Matrix
Pin Descriptions
Pin No. A0 - A18 I/O0 - I/O14 I/O15 I/O15 (A-1) A-1 Description Address Inputs Data Inputs/Outputs
Data Input/Output, Word Mode
LSB Address Input, Byte Mode Chip Enable Write Enable Output Enable Hardware Reset Selects Byte Mode or Word Mode Ready/ BUSY - Output Ground Power Supply Pin not connected internally
CE WE OE
RESET BYTE
RY/BY VSS VCC NC
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A29L800 Series
Absolute Maximum Ratings*
Storage Temperature Plastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0C to + 70C . . . . . . . . . . . . . . . . . . . . . . for -U series: -45C to +85C Ambient Temperature with Power Applied . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0C to + 70C . . . . . . . . . . . . . . . . . . . . . . for -U series: -45C to +85C Voltage with Respect to Ground VCC (Note 1) . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +4.0V A9, OE & RESET (Note 2) . . . . . . . . . . . . -0.5 to +12.5V All other pins (Note 1) . . . . . . . . . . . . -0.5V to VCC + 0.5V Output Short Circuit Current (Note 3) . . . . . . . . . 200mA
*Comments
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to this device. These are stress ratings only. Functional operation of this device at these or any other conditions above those indicated in the operational sections of these specification is not implied or intended. Exposure to the absolute maximum rating conditions for extended periods may affect device reliability.
Operating Ranges
Commercial (C) Devices Ambient Temperature (TA) . . . . . . . . . . . . . . 0C to +70C Extended Range Devices Ambient Temperature (TA) . . . . . . . . . . . . -45C to +85C VCC Supply Voltages VCC for all devices . . . . . . . . . . . . . . . . . . +2.7V to +3.6V Operating ranges define those limits between which the functionally of the device is guaranteed.
Notes:
1. Minimum DC voltage on input or I/O pins is -0.5V. During voltage transitions, input or I/O pins may undershoot VSS to -2.0V for periods of up to 20ns. Maximum DC voltage on input and I/O pins is VCC +0.5V. During voltage transitions, input or I/O pins may overshoot to VCC +2.0V for periods up to 20ns. 2. Minimum DC input voltage on A9, OE and RESET is -0.5V. During voltage transitions, A9, OE and RESET may overshoot VSS to -2.0V for periods of up to 20ns. Maximum DC input voltage on A9 is +12.5V which may overshoot to 14.0V for periods up to 20ns. 3. No more than one output is shorted at a time. Duration of the short circuit should not be greater than one second.
Device Bus Operations
This section describes the requirements and use of the device bus operations, which are initiated through the internal command register. The command register itself does not occupy any addressable memory location. The register is composed of latches that store the commands, along with the address and data information needed to
execute the command. The contents of the register serve as inputs to the internal state machine. The state machine outputs dictate the function of the device. The appropriate device bus operations table lists the inputs and control levels required, and the resulting output. The following subsections describe each of these operations in further detail.
Table 1. A29L800 Device Bus Operations Operation
CE
OE
WE
RESET
BYTE =VIH BYTE =VIL Read L L H H AIN DOUT DOUT I/O8~I/O4=High-Z I/O15=A-1 Write L H L H AIN DIN DIN CMOS Standby X VCC 0.3 V X High-Z High-Z High-Z VCC 0.3 V X Output Disable L H H H X High-Z High-Z High-Z Hardware Reset X X X L X High-Z High-Z High-Z Sector Protect Sector Address, L H L VID DIN X X (See Note 2) A6=L, A1=H, A0=L Sector Unprotect Sector Address, L H L VID DIN X X (See Note 2) A6=H, A1=H, A0=L Temporary Sector X X X VID AIN DIN DIN X Unprotect Legend: L = Logic Low = VIL, H = Logic High = VIH, VID = 12.0 0.5V, X = Don't Care, DIN = Data In, DOUT = Data Out, AIN = Address In Notes: 1. Addresses are A18:A0 in word mode (BYTE=VIH), A18: A-1 in byte mode (BYTE=VIL). 2. See the "Sector Protection/Unprotection" section and Temporary Sector Unprotect for more information.
A0 - A18 (Note 1)
I/O0 - I/O7
I/O8 - I/O15
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Word/Byte Configuration
The BYTE pin determines whether the I/O pins I/O15-I/O0 operate in the byte or word configuration. If the BYTE pin is set at logic "1", the device is in word configuration, I/O15I/O0 are active and controlled by CE and OE . If the BYTE pin is set at logic "0", the device is in byte configuration, and only I/O0-I/O7 are active and controlled by CE and OE . I/O8-I/O14 are tri-stated, and I/O15 pin is used as an input for the LSB(A-1) address function. select a sector. See the "Command Definitions" section for details on erasing a sector or the entire chip, or suspending/resuming the erase operation. After the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the internal register (which is separate from the memory array) on I/O7 - I/O0. Standard read cycle timings apply in this mode. Refer to the "Autoselect Mode" and "Autoselect Command Sequence" sections for more information. ICC2 in the DC Characteristics table represents the active current specification for the write mode. The "AC Characteristics" section contains timing specification tables and timing diagrams for write operations.
Requirements for Reading Array Data
To read array data from the outputs, the system must drive the CE and OE pins to VIL. CE is the power control and selects the device. OE is the output control and gates array data to the output pins. WE should remain at VIH all the time during read operation. The BYTE pin determines whether the device outputs array data in words and bytes. The internal state machine is set for reading array data upon device power-up, or after a hardware reset. This ensures that no spurious alteration of the memory content occurs during the power transition. No command is necessary in this mode to obtain array data. Standard microprocessor read cycles that assert valid addresses on the device address inputs produce valid data on the device data outputs. The device remains enabled for read access until the command register contents are altered. See "Reading Array Data" for more information. Refer to the AC Read Operations table for timing specifications and to the Read Operations Timings diagram for the timing waveforms, lCC1 in the DC Characteristics table represents the active current specification for reading array data.
Program and Erase Operation Status
During an erase or program operation, the system may check the status of the operation by reading the status bits on I/O7 - I/O0. Standard read cycle timings and ICC read specifications apply. Refer to "Write Operation Status" for more information, and to each AC Characteristics section for timing diagrams. Standby Mode When the system is not reading or writing to the device, it can place the device in the standby mode. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the OE input. The device enters the CMOS standby mode when the CE & RESET pins are both held at VCC 0.3V. (Note that this is a more restricted voltage range than VIH.) If CE and RESET are held at VIH, but not within VCC 0.3V, the device will be in the standby mode, but the standby current will be greater. The device requires the standard access time (tCE) before it is ready to read data. If the device is deselected during erasure or programming, the device draws active current until the operation is completed. ICC3 and ICC4 in the DC Characteristics tables represent the standby current specification.
Writing Commands/Command Sequences
To write a command or command sequence (which includes programming data to the device and erasing sectors of memory), the system must drive WE and CE to VIL, and OE to VIH. For program operations, the BYTE pin determines whether the device accepts program data in bytes or words, Refer to "Word/Byte Configuration" for more information. The device features an Unlock Bypass mode to facilitate faster programming. Once the device enters the Unlock Bypass mode, only two write cycles are required to program a word or byte, instead of four. The " Word / Byte Program Command Sequence" section has details on programming data to the device using both standard and Unlock Bypass command sequence. An erase operation can erase one sector, multiple sectors, or the entire device. The Sector Address Tables indicate the address range that each sector occupies. A "sector address" consists of the address inputs required to uniquely
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device energy consumption. The device automatically enables this mode when addresses remain stable for tACC +30ns. The automatic sleep mode is independent of the CE , WE and
OE control signals. Standard address access timings provide new data when addresses are changed. While in sleep mode, output data is latched and always available to the system. ICC4 in the DC Characteristics table represents the automatic sleep mode current specification.
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A29L800 Series
Output Disable Mode
When the OE input is at VIH, output from the device is disabled. The output pins are placed in the high impedance state. The RESET pin may be tied to the system reset circuitry. A system reset would thus also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory. If RESET is asserted during a program or erase operation, the RY/ BY pin remains a "0" (busy) until the internal reset operation is complete, which requires a time tREADY (during Embedded Algorithms). The system can thus monitor RY/ BY to determine whether the reset operation is complete. If RESET is asserted when a program or erase operation is not executing (RY/ BY pin is "1"), the reset operation is completed within a time of tREADY (not during Embedded Algorithms). The system can read data tRH after the RESET pin return to VIH. Refer to the AC Characteristics tables for RESET parameters and diagram.
RESET : Hardware Reset Pin
The RESET pin provides a hardware method of resetting the device to reading array data. When the system drives the RESET pin low for at least a period of tRP, the device immediately terminates any operation in progress, tristates all data output pins, and ignores all read/write attempts for the duration of the RESET pulse. The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready to accept another command sequence, to ensure data integrity. Current is reduced for the duration of the RESET pulse. When RESET is held at VSS 0.3V, the device draws CMOS standby current (ICC4 ). If RESET is held at VIL but not within VSS 0.3V, the standby current will be greater.
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Table 2. A29L800 Top Boot Block Sector Address Table
Sector Size (Kbytes/ Kwords) 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 32/16 8/4 8/4 16/8 Address Range (in hexadecimal) Byte Mode Word Mode (x 8) (x16) 00000h - 0FFFFh 10000h - 1FFFFh 20000h - 2FFFFh 30000h - 3FFFFh 40000h - 4FFFFh 50000h - 5FFFFh 60000h - 6FFFFh 70000h - 7FFFFh 80000h - 8FFFFh 90000h - 9FFFFh A0000h - AFFFFh B0000h - BFFFFh C0000h - CFFFFh E0000h - EFFFFh F0000h - F7FFFh 00000h - 07FFFh 08000h - 0FFFFh 10000h - 17FFFh 18000h - 1FFFFh 20000h - 27FFFh 28000h - 2FFFFh 30000h - 37FFFh 38000h - 3FFFFh 40000h - 47FFFh 48000h - 4FFFFh 50000h - 57FFFh 58000h - 5FFFFh 60000h - 67FFFh 70000h - 77FFFh 78000h - 7BFFFh
Sector SA0 SA1 SA2 SA3 SA4 SA5 SA6 SA7 SA8 SA9 SA10 SA11 SA12 SA13 SA14 SA15 SA16 SA17 SA18
A18 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 1 1 1
A17 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 1 1 1
A16 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1 1 1 1
A15 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 1 1 1
A14 X X X X X X X X X X X X X X X 0 1 1 1
A13 X X X X X X X X X X X X X X X X 0 0 1
A12 X X X X X X X X X X X X X X X X 0 1 X
D0000h - DFFFFh 68000h - 6FFFFh
F8000h - F9FFFh 7C000h - 7CFFFh FA000h - FBFFFh 7D000h - 7DFFFh FC000h - FFFFFh 7E000h - 7FFFFh
Note: Address range is A18 : A-1 in byte mode and A18 : A0 in word mode. See "Word/Byte Configuration" section.
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Table 3. A29L800 Bottom Boot Block Sector Address Table
Sector Size (Kbytes/ Kwords) 16/8 8/4 8/4 32/16 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 64/32 Address Range (in hexadecimal) Byte Mode Word Mode (x 8) (x16) 00000h - 03FFFh 04000h - 05FFFh 06000h - 07FFFh 08000h - 0FFFFh 10000h - 1FFFFh 20000h - 2FFFFh 30000h - 3FFFFh 40000h - 4FFFFh 50000h - 5FFFFh 60000h - 6FFFFh 70000h - 7FFFFh 80000h - 8FFFFh 90000h - 9FFFFh A0000h - AFFFFh B0000h - BFFFFh C0000h - CFFFFh D0000h - DFFFFh E0000h - EFFFFh F0000h - FFFFFh 00000 - 01FFF 02000 - 02FFF 03000 - 03FFF 04000 - 07FFF 08000 - 0FFFF 10000 - 17FFF 18000 - 1FFFF 20000 - 27FFF 28000 - 2FFFF 30000 - 37FFF 38000 - 3FFFF 40000 - 47FFF 48000 - 4FFFF 50000 - 57FFF 58000 - 5FFFF 60000 - 67FFF 68000 - 6FFFF 70000 - 77FFF 78000 - 7FFFF
Sector SA0 SA1 SA2 SA3 SA4 SA5 SA6 SA7 SA8 SA9 SA10 SA11 SA12 SA13 SA14 SA15 SA16 SA17 SA18
A18 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1
A17 0 0 0 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1
A16 0 0 0 0 0 1 1 0 0 1 1 0 0 1 1 0 0 1 1
A15 0 0 0 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1
A14 0 0 0 1 X X X X X X X X X X X X X X X
A13 0 1 1 X X X X X X X X X X X X X X X X
A12 X 0 1 X X X X X X X X X X X X X X X X
Note: Address range is A18 : A-1 in byte mode and A18 : A0 in word mode. See "Word/Byte Configuration" section.
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Autoselect Mode
The autoselect mode provides manufacturer and device identification, and sector protection verification, through identifier codes output on I/O7 - I/O0. This mode is primarily intended for programming equipment to automatically match a device to be programmed with its corresponding programming algorithm. However, the autoselect codes can also be accessed in-system through the command register. When using programming equipment, the autoselect mode requires VID (11.5V to 12.5 V) on address pin A9. Address pins A6, A1, and A0 must be as shown in Autoselect Codes (High Voltage Method) table. In addition, when verifying sector protection, the sector address must appear on the appropriate highest order address bits. Refer to the corresponding Sector Address Tables. The Command Definitions table shows the remaining address bits that are don't care. When all necessary bits have been set as required, the programming equipment may then read the corresponding identifier code on I/O7 - I/O0.To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in the Command Definitions table. This method does not require VID. See "Command Definitions" for details on using the autoselect mode.
Table 4. A29L800 Autoselect Codes (High Voltage Method)
Description Mode
CE
OE
WE
A18 to A12
A11 to A10 X X
A9
A8 to A7
A6
A5 to A2
A1
A0
I/O8 to I/O15
I/O7 to I/O0 37h 1Ah 1Ah 9Bh 9Bh 7Fh 01h (protected) 00h (unprotected)
Manufacturer ID: AMIC Device ID: A29L800 (Top Boot Block) Device ID: A29L800 (Bottom Boot Block) Continuation ID Word Byte Word Byte
L L
L L
H H
X X
VID VID
X X
L L
X X
L L
L H
X B3h X B3h
L L
L L
H H
X X
X X
VID VID
X X
L L
X X
L H
H H
X X X
Sector Protection Verification
L
L
H
SA
X
VID
X
L
X
H
L X
L=Logic Low= VIL, H=Logic High=VIH, SA=Sector Address, X=Don't Care. Note: The autoselect codes may also be accessed in-system via command sequences.
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Sector Protection/Unprotection
The hardware sector protection feature disables both program and erase operations in any sector. The hardware sector unprotection feature re-enables both program and erase operations in previously protected sectors. It is possible to determine whether a sector is protected or unprotected. See "Autoselect Mode" for details. Sector protection / unprotection can be implemented via two methods. The primary method requires VID on the RESET pin only, and can be implemented either in-system or via programming equipment. Figure 2 shows the algorithm and the Sector Protect / Unprotect Timing Diagram illustrates the timing waveforms for this feature. This method uses standard microprocessor bus cycle timing. For sector unprotect, all unprotected sectors must first be protected prior to the first sector unprotect write cycle. The alternate method must be implemented using programming equipment. The procedure requires a high voltage (VID) on address pin A9 and the control pins. The device is shipped with all sectors unprotected. It is possible to determine whether a sector is protected or unprotected. See "Autoselect Mode" for details.
Temporary Sector Unprotect
This feature allows temporary unprotection of previous protected sectors to change data in-system. The Sector Unprotect mode is activated by setting the RESET pin to VID. During this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. Once VID is removed from the RESET pin, all the previously protected sectors are protected again. Figure 1 shows the algorithm, and the Temporary Sector Unprotect diagram shows the timing waveforms, for this feature.
START
RESET = VID (Note 1)
Hardware Data Protection
The requirement of command unlocking sequence for programming or erasing provides data protection against inadvertent writes (refer to the Command Definitions table). In addition, the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by spurious system level signals during VCC power-up transitions, or from system noise. The device is powered up to read array data to avoid accidentally writing data to the array.
Perform Erase or Program Operations
RESET = VIH
Write Pulse "Glitch" Protection
Noise pulses of less than 5ns (typical) on OE , CE or WE do not initiate a write cycle.
Temporary Sector Unprotect Completed (Note 2)
Logical Inhibit
Write cycles are inhibited by holding any one of OE =VIL, CE = VIH or WE = VIH. To initiate a write cycle, CE and
Notes: 1. All protected sectors unprotected. 2. All previously protected sectors are protected once again.
WE must be a logical zero while OE is a logical one.
Figure 1. Temporary Sector Unprotect Operation
Power-Up Write Inhibit
If WE = CE = VIL and OE = VIH during power up, the device does not accept commands on the rising edge of WE . The internal state machine is automatically reset to reading array data on the initial power-up.
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START Protect all sectors: The indicated portion of the sector protect algorithm must be performed for all unprotected sectors prior to issuing the first sector unprotect address START
PLSCNT=1
PLSCNT=1
RESET=V ID
RESET=V ID
Wait 1 us
Wait 1 us
Temporary Sector Unprotect Mode
No
First Write Cycle=60h? Yes Set up sector address
No
First Write Cycle=60h? Yes All sectors protected? Yes Set up first sector address
No
Temporary Sector Unprotect Mode
Sector Protect Write 60h to sector address with A6=0, A1=1, A0=0
Wait 150 us Verify Sector Protect: Write 40h to sector address with A6=0, A1=1, A0=0
Sector Unprotect: Write 60h to sector address with A6=1, A1=1, A0=0 Reset PLSCNT=1
Increment PLSCNT
Wait 15 ms Verify Sector Unprotect : Write 40h to sector address with A6=1, A1=1, A0=0
Read from sector address with A6=0, A1=1, A0=0 No PLSCNT =25? Yes Device failed No Data=01h?
Increment PLSCNT
Read from sector address with A6=1, A1=1, A0=0 No Set up next sector address
Yes Protect another sector? No Remove V ID from RESET Write reset command Yes PLSCNT= 1000? No Data=00h?
Yes Device failed
Yes Last sector verified? Yes Remove V ID from RESET No
Sector Protect Algorithm
Sector Protect complete
Sector Unprotect Algorithm
Write reset Command Sector Unprotect complete
Figure 2. In-System Sector Protect/Unprotect Algorithms
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Command Definitions
Writing specific address and data commands or sequences into the command register initiates device operations. The Command Definitions table defines the valid register command sequences. Writing incorrect address and data values or writing them in the improper sequence resets the device to reading array data. All addresses are latched on the falling edge of WE or CE , whichever happens later. All data is latched on the rising edge of WE or CE , whichever happens first. Refer to the appropriate timing diagrams in the "AC Characteristics" section.
Autoselect Command Sequence
The autoselect command sequence allows the host system to access the manufacturer and devices codes, and determine whether or not a sector is protected. The Command Definitions table shows the address and data requirements. This method is an alternative to that shown in the Autoselect Codes (High Voltage Method) table, which is intended for PROM programmers and requires VID on address bit A9. The autoselect command sequence is initiated by writing two unlock cycles, followed by the autoselect command. The device then enters the autoselect mode, and the system may read at any address any number of times, without initiating another command sequence. A read cycle at address XX00h retrieves the manufacturer code and another read cycle at XX03h retrieves the continuation code. A read cycle at address XX01h returns the device code. A read cycle containing a sector address (SA) and the address 02h in returns 01h if that sector is protected, or 00h if it is unprotected. Refer to the Sector Address tables for valid sector addresses. The system must write the reset command to exit the autoselect mode and return to reading array data.
Reading Array Data
The device is automatically set to reading array data after device power-up. No commands are required to retrieve data. The device is also ready to read array data after completing an Embedded Program or Embedded Erase algorithm. After the device accepts an Erase Suspend command, the device enters the Erase Suspend mode. The system can read array data using the standard read timings, except that if it reads at an address within erase-suspended sectors, the device outputs status data. After completing a programming operation in the Erase Suspend mode, the system may once again read array data with the same exception. See "Erase Suspend/Erase Resume Commands" for more information on this mode. The system must issue the reset command to re-enable the device for reading array data if I/O5 goes high, or while in the autoselect mode. See the "Reset Command" section, next. See also "Requirements for Reading Array Data" in the "Device Bus Operations" section for more information. The Read Operations table provides the read parameters, and Read Operation Timings diagram shows the timing diagram.
Word/Byte Program Command Sequence
The system may program the device by word or byte, depending on the state of the BYTE pin. Programming is a four-bus-cycle operation. The program command sequence is initiated by writing two unlock write cycles, followed by the program set-up command. The program address and data are written next, which in turn initiate the Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically provides internally generated program pulses and verify the programmed cell margin. Table 5 shows the address and data requirements for the byte program command sequence. When the Embedded Program algorithm is complete, the device then returns to reading array data and addresses are longer latched. The system can determine the status of the program operation by using I/O7, I/O6, or RY/ BY . See "White Operation Status" for information on these status bits. Any commands written to the device during the Embedded Program Algorithm are ignored. Note that a hardware reset immediately terminates the programming operation. The Byte Program command sequence should be reinitiated once the device has reset to reading array data, to ensure data integrity. Programming is allowed in any sequence and across sector boundaries. A bit cannot be programmed from a "0" back to a "1". Attempting to do so may halt the operation and set I/O5 to "1", or cause the Data Polling algorithm to indicate the operation was successful. However, a succeeding read will show that the data is still "0". Only erase operations can convert a "0" to a "1".
Reset Command
Writing the reset command to the device resets the device to reading array data. Address bits are don't care for this command. The reset command may be written between the sequence cycles in an erase command sequence before erasing begins. This resets the device to reading array data. Once erasure begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in a program command sequence before programming begins. This resets the device to reading array data (also applies to programming in Erase Suspend mode). Once programming begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in an autoselect command sequence. Once in the autoselect mode, the reset command must be written to return to reading array data (also applies to autoselect during Erase Suspend). If I/O5 goes high during a program or erase operation, writing the reset command returns the device to reading array data (also applies during Erase Suspend).
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START
Write Program Command Sequence
During the unlock bypass mode, only the Unlock Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system must issue the twocycle unlock bypass reset command sequence. The first cycle must contain the data 90h; the second cycle the data 00h. Addresses are don't care for both cycle. The device returns to reading array data. Figure 3 illustrates the algorithm for the program operation. See the Erase/Program Operations in "AC Characteristics" for parameters, and to Program Operation Timings for timing diagrams.
Embedded Program algorithm in progress
Data Poll from System
Chip Erase Command Sequence
Chip erase is a six-bus-cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the chip erase command, which in turn invokes the Embedded Erase algorithm. The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. The Command Definitions table shows the address and data requirements for the chip erase command sequence. Any commands written to the chip during the Embedded Erase algorithm are ignored. The system can determine the status of the erase operation by using I/O7, I/O6, or I/O2. See "Write Operation Status" for information on these status bits. When the Embedded Erase algorithm is complete, the device returns to reading array data and addresses are no longer latched. Figure 4 illustrates the algorithm for the erase operation. See the Erase/Program Operations tables in "AC Characteristics" for parameters, and to the Chip/Sector Erase Operation Timings for timing waveforms.
Verify Data ? No Yes
Increment Address
Last Address ?
Yes Programming Completed
Note : See the appropriate Command Definitions table for program command sequence.
Sector Erase Command Sequence
Sector erase is a six-bus-cycle operation. The sector erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the address of the sector to be erased, and the sector erase command. The Command Definitions table shows the address and data requirements for the sector erase command sequence. The device does not require the system to preprogram the memory prior to erase. The Embedded Erase algorithm automatically programs and verifies the sector for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. After the command sequence is written, a sector erase timeout of 50s begins. During the time-out period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any sequence, and the number of sectors may be from one sector to all sectors. The time between these additional cycles must be less than 50s, otherwise the last address and command might not be accepted, and erasure may begin. It is recommended that processor interrupts be disabled during this time to ensure all commands are accepted. The interrupts
Figure 3. Program Operation
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to program bytes or words to the device faster than using the standard program command sequence. The unlock bypass command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle containing the unlock bypass command, 20h. The device then enters the unlock bypass mode. A two-cycle unlock bypass program command sequence is all that is required to program in this mode. The first cycle in this sequence contains the unlock bypass program command, A0h; the second cycle contains the program address and data. Additional data is programmed in the same manner. This mode dispenses with the initial two unlock cycles required in the standard program command sequence, resulting in faster total programming time. Table 5 shows the requirements for the command sequence. PRELIMINARY (September, 2002, Version 0.2) 14
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can be re-enabled after the last Sector Erase command is written. If the time between additional sector erase commands can be assumed to be less than 50s, the system need not monitor I/O3. Any command other than Sector Erase or Erase Suspend during the time-out period resets the device to reading array data. The system must rewrite the command sequence and any additional sector addresses and commands. The system can monitor I/O3 to determine if the sector erase timer has timed out. (See the " I/O3: Sector Erase Timer" section.) The time-out begins from the rising edge of the final WE pulse in the command sequence. Once the sector erase operation has begun, only the Erase Suspend command is valid. All other commands are ignored. When the Embedded Erase algorithm is complete, the device returns to reading array data and addresses are no longer latched. The system can determine the status of the erase operation by using I/O7, I/O6, or I/O2. Refer to "Write Operation Status" for information on these status bits. 4 illustrates the algorithm for the erase operation. Refer to the Erase/Program Operations tables in the "AC Characteristics" section for parameters, and to the Sector Erase Operations Timing diagram for timing waveforms. The system may also write the autoselect command sequence when the device is in the Erase Suspend mode. The device allows reading autoselect codes even at addresses within erasing sectors, since the codes are not stored in the memory array. When the device exits the autoselect mode, the device reverts to the Erase Suspend mode, and is ready for another valid operation. See "Autoselect Command Sequence" for more information. The system must write the Erase Resume command (address bits are "don't care") to exit the erase suspend mode and continue the sector erase operation. Further writes of the Resume command are ignored. Another Erase Suspend command can be written after the device has resumed erasing.
START
Write Erase Command Sequence
Erase Suspend/Erase Resume Commands
The Erase Suspend command allows the system to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. This command is valid only during the sector erase operation, including the 50s time-out period during the sector erase command sequence. The Erase Suspend command is ignored if written during the chip erase operation or Embedded Program algorithm. Writing the Erase Suspend command during the Sector Erase time-out immediately terminates the time-out period and suspends the erase operation. Addresses are "don't cares" when writing the Erase Suspend command. When the Erase Suspend command is written during a sector erase operation, the device requires a maximum of 20s to suspend the erase operation. However, when the Erase Suspend command is written during the sector erase timeout, the device immediately terminates the time-out period and suspends the erase operation. After the erase operation has been suspended, the system can read array data from or program data to any sector not selected for erasure. (The device "erase suspends" all sectors selected for erasure.) Normal read and write timings and command definitions apply. Reading at any address within erase-suspended sectors produces status data on I/O7 - I/O0. The system can use I/O7, or I/O6 and I/O2 together, to determine if a sector is actively erasing or is erasesuspended. See "Write Operation Status" for information on these status bits. After an erase-suspended program operation is complete, the system can once again read array data within non-suspended sectors. The system can determine the status of the program operation using the I/O7 or I/O6 status bits, just as in the standard program operation. See "Write Operation Status" for more information.
Data Poll from System
Embedded Erase algorithm in progress
No Data = FFh ?
Yes
Erasure Completed
Note : 1. See the appropriate Command Definitions table for erase command sequences. 2. See "I/O3 : Sector Erase Timer" for more information.
Figure 4. Erase Operation
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Table 5. A29L800 Command Definitions
Command Sequence (Note 1) Read (Note 6) Reset (Note 7) Word Manufacturer ID Device ID, Top Boot Block Device ID, Bottom Boot Block Continuation ID Byte Word Byte Word Byte Word Byte Sector Protect Verify (Note 9) Word 4 Byte Word Program Unlock Bypass Byte 4 Word Byte 3 2 2 6 6 1 1 AAA 555 AAA 555 AAA AA AA 4 4 4 Cycles Bus Cycles (Notes 2 - 5) First Addr Data RA XXX 555 AAA 555 AAA 555 AAA 555 AAA 555 AA 555 2AA 555 2AA 555 PA XXX 2AA 555 2AA 555 55 55 PD 00 55 55 555 AAA 555 AAA 80 80 555 AAA 555 AAA AA AA 2AA 555 2AA 555 55 55 555 AAA SA 10 30 AA RD F0 AA AA AA 2AA 555 2AA 555 2AA 555 2AA 555 2AA 55 AAA 555 AAA 555 AAA A0 20 55 55 55 55 555 AAA 555 AAA 555 AAA 555 AAA 555 90 90 90 90 90 X00 37 Second Addr Data Third Fourth Fifth Sixth Addr Data Addr Data Addr Data Addr Data
1 1
Autoselect (Note 8)
X01 B31A X02 1A X01 B39B X02 X03 X06 (SA) XX00 X02 XX01 00 (SA) X04 01 PA PD 9B 7F
4
Unlock Bypass Program (Note 10) Unlock Bypass Reset (Note 11) Word Chip Erase Sector Erase Erase Suspend (Note 12) Erase Resume (Note 13) Byte Word Byte
XXX A0 XXX 90 555 AAA 555 AAA XXX XXX AA AA B0 30
Legend: X = Don't care RA = Address of the memory location to be read. RD = Data read from location RA during read operation. PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the WE or CE pulse, whichever happens later. PD = Data to be programmed at location PA. Data latches on the rising edge of WE or CE pulse, whichever happens first. SA = Address of the sector to be verified (in autoselect mode) or erased. Address bits A18 - A12 select a unique sector.
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Note: 1. See Table 1 for description of bus operations. 2. All values are in hexadecimal. 3. Except when reading array or autoselect data, all bus cycles are write operation. 4. Data bits I/O15~I/O8 are don't care for unlock and command cycles. 5. Address bits A18 - A11 are don't cares for unlock and command cycles, unless SA or PA required. 6. No unlock or command cycles required when reading array data. 7. The Reset command is required to return to reading array data when device is in the autoselect mode, or if I/O5 goes high (while the device is providing status data). 8. The fourth cycle of the autoselect command sequence is a read cycle. 9. The data is 00h for an unprotected sector and 01h for a protected sector. See "Autoselect Command Sequence" for more information. 10. The Unlock Bypass command is required prior to the Unlock Bypass Program command. 11. The Unlock Bypass Reset command is required to return to reading array data when the device is in the unlock bypass mode. 12. The system may read and program in non-erasing sectors, or enter the autoselect mode, when in the Erase Suspend mode. 13. The Erase Resume command is valid only during the Erase Suspend mode.
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Write Operation Status
Several bits, I/O2, I/O3, I/O5, I/O6, I/O7, RY/BY are provided in the A29L800 to determine the status of a write operation. Table 6 and the following subsections describe the functions of these status bits. I/O7, I/O6 and RY/ BY each offer a method for determining whether a program or erase operation is complete or in progress. These three bits are discussed first.
START
Read I/O7-I/O0 Address = VA
I/O7: Data Polling
The Data Polling bit, I/O7, indicates to the host system whether an Embedded Algorithm is in progress or completed, or whether the device is in Erase Suspend. Data Polling is valid after the rising edge of the final WE pulse in the program or erase command sequence. During the Embedded Program algorithm, the device outputs on I/O7 the complement of the datum programmed to I/O7. This I/O7 status also applies to programming during Erase Suspend. When the Embedded Program algorithm is complete, the device outputs the datum programmed to I/O7. The system must provide the program address to read valid status information on I/O7. If a program address falls within a protected sector, Data Polling on I/O7 is active for approximately 2s, then the device returns to reading array data. During the Embedded Erase algorithm, Data Polling produces a "0" on I/O7. When the Embedded Erase algorithm is complete, or if the device enters the Erase Suspend mode, Data Polling produces a "1" on I/O7.This is analogous to the complement/true datum output described for the Embedded Program algorithm: the erase function changes all the bits in a sector to "1"; prior to this, the device outputs the "complement," or "0." The system must provide an address within any of the sectors selected for erasure to read valid status information on I/O7. After an erase command sequence is written, if all sectors selected for erasing are protected, Data Polling on I/O7 is active for approximately 100s, then the device returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. When the system detects I/O7 has changed from the complement to true data, it can read valid data at I/O7 - I/O0 on the following read cycles. This is because I/O7 may change asynchronously with I/O0 - I/O6 while Output Enable ( OE ) is asserted low. The Data Polling Timings (During Embedded Algorithms) in the "AC Characteristics" section illustrates this. Table 6 shows the outputs for Data Polling on I/O7. Figure 5 shows the Data Polling algorithm.
Yes I/O7 = Data ?
No
No I/O5 = 1?
Yes Read I/O7 - I/O0 Address = VA
Yes I/O7 = Data ?
No
FAIL
PASS
Note : 1. VA = Valid address for programming. During a sector erase operation, a valid address is an address within any sector selected for erasure. During chip erase, a valid address is any non-protected sector address. 2. I/O7 should be rechecked even if I/O5 = "1" because I/O7 may change simultaneously with I/O5.
Figure 5. Data Polling Algorithm
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RY/BY : Read/ Busy The RY/ BY is a dedicated, open-drain output pin that indicates whether an Embedded algorithm is in progress or complete. The RY/ BY status is valid after the rising edge of the final WE pulse in the command sequence. Since RY/BY is an open-drain output, several RY/ BY pins can be tied together in parallel with a pull-up resistor to VCC. (The RY/BY pin is not available on the 44-pin SOP package) If the output is low (Busy), the device is actively erasing or programming. (This includes programming in the Erase Suspend mode.) If the output is high (Ready), the device is ready to read array data (including during the Erase Suspend mode), or is in the standby mode. Table 6 shows the outputs for RY/ BY . Refer to " RESET Timings", "Timing Waveforms for Program Operation" and "Timing Waveforms for Chip/Sector Erase Operation" for more information.
I/O2: Toggle Bit II
The "Toggle Bit II" on I/O2, when used with I/O6, indicates whether a particular sector is actively erasing (that is, the Embedded Erase algorithm is in progress), or whether that sector is erase-suspended. Toggle Bit II is valid after the rising edge of the final WE pulse in the command sequence. I/O2 toggles when the system reads at addresses within those sectors that have been selected for erasure. (The system may use either OE or CE to control the read cycles.) But I/O2 cannot distinguish whether the sector is actively erasing or is erase-suspended. I/O6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sector and mode information. Refer to Table 6 to compare outputs for I/O2 and I/O6. Figure 6 shows the toggle bit algorithm in flowchart form, and the section " I/O2: Toggle Bit II" explains the algorithm. See also the " I/O6: Toggle Bit I" subsection. Refer to the Toggle Bit Timings figure for the toggle bit timing diagram. The I/O2 vs. I/O6 figure shows the differences between I/O2 and I/O6 in graphical form.
I/O6: Toggle Bit I
Toggle Bit I on I/O6 indicates whether an Embedded Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address, and is valid after the rising edge of the final WE pulse in the command sequence (prior to the program or erase operation), and during the sector erase time-out. During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause I/O6 to toggle. (The system may use either OE or CE to control the read cycles.) When the operation is complete, I/O6 stops toggling. After an erase command sequence is written, if all sectors selected for erasing are protected, I/O6 toggles for approximately 100s, then returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. The system can use I/O6 and I/O2 together to determine whether a sector is actively erasing or is erase-suspended. When the device is actively erasing (that is, the Embedded Erase algorithm is in progress), I/O6 toggles. When the device enters the Erase Suspend mode, I/O6 stops toggling. However, the system must also use I/O2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use I/O7 (see the subsection on " I/O7 : Data Polling"). If a program address falls within a protected sector, I/O6 toggles for approximately 2s after the program command sequence is written, then returns to reading array data. I/O6 also toggles during the erase-suspend-program mode, and stops toggling once the Embedded Program algorithm is complete. The Write Operation Status table shows the outputs for Toggle Bit I on I/O6. Refer to Figure 6 for the toggle bit algorithm, and to the Toggle Bit Timings figure in the "AC Characteristics" section for the timing diagram. The I/O2 vs. I/O6 figure shows the differences between I/O2 and I/O6 in graphical form. See also the subsection on " I/O2: Toggle Bit II".
Reading Toggle Bits I/O6, I/O2
Refer to Figure 6 for the following discussion. Whenever the system initially begins reading toggle bit status, it must read I/O7 - I/O0 at least twice in a row to determine whether a toggle bit is toggling. Typically, a system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on I/O7 - I/O0 on the following read cycle. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of I/O5 is high (see the section on I/O5). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as I/O5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that the system initially determines that the toggle bit is toggling and I/O5 has not gone high. The system may continue to monitor the toggle bit and I/O5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of Figure 6).
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I/O5: Exceeded Timing Limits
I/O5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. Under these conditions I/O5 produces a "1." This is a failure condition that indicates the program or erase cycle was not successfully completed. The I/O5 failure condition may appear if the system tries to program a "1 "to a location that is previously programmed to "0." Only an erase operation can change a "0" back to a "1." Under this condition, the device halts the operation, and when the operation has exceeded the timing limits, I/O5 produces a "1." Under both these conditions, the system must issue the reset command to return the device to reading array data.
START
Read I/O7-I/O0
Read I/O7-I/O0
(Note 1)
I/O3: Sector Erase Timer
After writing a sector erase command sequence, the system may read I/O3 to determine whether or not an erase operation has begun. (The sector erase timer does not apply to the chip erase command.) If additional sectors are selected for erasure, the entire time-out also applies after each additional sector erase command. When the time-out is complete, I/O3 switches from "0" to "1." The system may ignore I/O3 if the system can guarantee that the time between additional sector erase commands will always be less than 50s. See also the "Sector Erase Command Sequence" section. After the sector erase command sequence is written, the system should read the status on I/O7 ( Data Polling) or I/O6 (Toggle Bit I) to ensure the device has accepted the command sequence, and then read I/O3. If I/O3 is "1", the internally controlled erase cycle has begun; all further commands (other than Erase Suspend) are ignored until the erase operation is complete. If I/O3 is "0", the device will accept additional sector erase commands. To ensure the command has been accepted, the system software should check the status of I/O3 prior to and following each subsequent sector erase command. If I/O3 is high on the second status check, the last command might not have been accepted. Table 6 shows the outputs for I/O3.
Toggle Bit = Toggle ? Yes No No
I/O5 = 1?
Yes Read I/O7 - I/O0 Twice
(Notes 1,2)
Toggle Bit = Toggle ?
No
Yes Program/Erase Operation Not Commplete, Write Reset Command
Program/Erase Operation Complete
Notes : 1. Read toggle bit twice to determine whether or not it is toggling. See text. 2. Recheck toggle bit because it may stop toggling as I/O5 changes to "1". See text.
Figure 6. Toggle Bit Algorithm
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Table 6. Write Operation Status
Operation Standard Mode Erase Suspend Mode Embedded Program Algorithm Embedded Erase Algorithm Reading within Erase Suspended Sector Reading within Non-Erase Suspended Sector Erase-Suspend-Program Notes: 1. I/O7 and I/O2 require a valid address when reading status information. Refer to the appropriate subsection for further details. 2. I/O5 switches to "1" when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits. See "I/O5: Exceeded Timing Limits" for more information. I/O7 (Note 1) I/O6 I/O5 (Note 2) Toggle Toggle No toggle Data Toggle 0 0 0 Data 0 N/A 1 N/A Data N/A I/O3 I/O2 (Note 1) No toggle Toggle Toggle Data N/A 0 0 1 1 0 RY/BY
I/O7
0 1 Data
I/O7
Maximum Negative Input Overshoot
20ns
+0.8V
20ns
-0.5V
-2.0V
20ns
Maximum Positive Input Overshoot
20ns
VCC+2.0V
VCC+0.5V
2.0V 20ns 20ns
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DC Characteristics
CMOS Compatible (TA=0C to 70C or -45C to +85C) Parameter Parameter Description Symbol ILI Input Load Current ILIT ILO A9 Input Load Current Output Leakage Current Test Description VIN = VSS to VCC. VCC = VCC Max VCC = VCC Max, A9 =12.5V VOUT = VSS to VCC. VCC = VCC Max Min. Typ. Max. 1.0 35 1.0 9 2 9 2 20 0.2 0.2 0.2 -0.5 0.7 x VCC VCC = 3.3 V IOL = 4.0mA, VCC = VCC Min IOH = -2.0 mA, VCC = VCC Min IOH = -100 A, VCC = VCC Min 11.5 16 4 16 4 30 5 5 5 0.8 VCC + 0.3 12.5 0.45 0.85 x VCC VCC - 0.4 mA A A A V V V V V V mA Unit A A A
CE = VIL, OE = VIH Byte Mode
ICC1 VCC Active Read Current (Notes 1, 2)
5 MHz 1 MHz 5 MHz 1 MHz
CE = VIL, OE = VIH
Word Mode
ICC2 ICC3 ICC4 ICC5 VIL VIH VID VOL VOH1 VOH2
VCC Active Write (Program/Erase) Current (Notes 2, 3, 4) VCC Standby Current (Note 2) VCC Standby Current During Reset (Note 2) Automatic Sleep Mode (Note 2, 4, 5) Input Low Level Input High Level Voltage for Autoselect and Temporary Unprotect Sector Output Low Voltage Output High Voltage
CE = VIL, OE =VIH CE = VIH, RESET= VCC 0.3V
RESET= VSS 0.3V
VIH = VCC 0.3V; VIL = VSS 0.3V
Notes: 1. The ICC current listed is typically less than 2 mA/MHz, with OE at VIH. Typical VCC is 3.0V. 2. Maximum ICC specifications are tested with VCC = VCC max. 3. ICC active while Embedded Algorithm (program or erase) is in progress. 4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30ns. Typical sleep mode current is 200nA. 5. Not 100% tested.
PRELIMINARY
(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
DC Characteristics (continued)
Zero Power Flash 25
Supply Current in mA
20
15
10
5
0 0 500 1000 1500 2000 Time in ns Note: Addresses are switching at 1MHz 2500 3000 3500 4000
ICC1 Current vs. Time (Showing Active and Automatic Sleep Currents)
10 3.6V 8 2.7V Supply Current in mA 6
4
2
0 1 Note : T = 25 C 2 3 Frequency in MHz 4 5
Typical ICC1 vs. Frequency
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AMIC Technology, Inc.
A29L800 Series
AC Characteristics
Read Only Operations (TA=0C to 70C or -45C to +85C) Parameter Symbols JEDEC tAVAV tAVQV Std tRC tACC Read Cycle Time (Note 1) Address to Output Delay Min. Description Test Setup -70 70 70 Speed -90 90 90 ns ns Unit
CE = VIL OE = VIL OE = VIL
Max.
tELQV tGLQV
tCE tOE
Chip Enable to Output Delay Output Enable to Output Delay Read Output Enable Hold Time (Note 1)
Max. Max. Min. Min. Max.
70 30 0 10 25 25
90 35 0 10 30 30
ns ns ns ns ns ns
tOEH
Toggle and
Data Polling
tEHQZ tGHQZ tDF tDF Chip Enable to Output High Z (Notes 1) Output Enable to Output High Z (Notes 1) Output Hold Time from Addresses, CE or OE , Whichever Occurs First (Note 1)
tAXQX
tOH
Min.
0
0
ns
Notes: 1. Not 100% tested. 2. See Test Conditions and Test Setup for test specifications.
Timing Waveforms for Read Only Operation
tRC Addresses tACC CE tDF OE tOEH WE Output High-Z tCE Output Valid tOH High-Z tOE Addresses Stable
RESET 0V RY/BY
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(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
AC Characteristics
Hardware Reset (RESET ) (TA=0C to 70C or -45C to +85C) Parameter JEDEC Std tREADY tREADY tRP tRH tRB tRPD Description Test Setup Max Max Min Min Min Min All Speed Options 20 500 500 50 0 20 Unit s ns ns ns ns s
RESET Pin Low (During Embedded Algorithms) to Read or Write (See Note) RESET Pin Low (Not During Embedded Algorithms) to Read or Write (See Note) RESET Pulse Width RESET High Time Before Read (See Note)
RY/BY Recovery Time
RESET Low to Standby Mode
Note: Not 100% tested.
RESET Timings
RY/BY
CE, OE tRH RESET
tRP tReady Reset Timings NOT during Embedded Algorithms Reset Timings during Embedded Algorithms tReady
RY/BY
~~ ~~
tRB
CE, OE
~ ~
RESET
tRP
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(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Temporary Sector Unprotect (TA=0C to 70C or -45C to +85C)
Parameter JEDEC Std tVIDR tRSP Description VID Rise and Fall Time (See Note) Min Min All Speed Options 500 4 Unit ns s
RESET Setup Time for Temporary Sector Unprotect
Note: Not 100% tested.
Temporary Sector Unprotect Timing Diagram
12V 0 or 3V RESET CE tVIDR
Program or Erase Command Sequence
~ ~
0 or 3V tVIDR
~ ~
WE
~~ ~~
tRSP RY/BY
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(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
AC Characteristics
Word/Byte Configuration (BYTE ) (TA=0C to 70C or -45C to +85C) Parameter JEDEC Std tELFL/tELFH tFLQZ tHQV Description All Speed Options -70 -90 5 25 70 30 90 ns ns ns Unit
CE to BYTE Switching Low or High
BYTE Switching Low to Output High-Z BYTE Switching High to Output Active
Max Max Min
BYTE Timings for Read Operations
CE
OE BYTE
tELFL
BYTE Switching from word to byte mode
I/O0-I/O14
Data Output (I/O0-I/O14)
Data Output (I/O0-I/O7)
I/O15 (A-1)
tELFH
I/O15 Output tFLQZ
Address Input
BYTE I/O0-I/O14
Data Output (I/O0-I/O7) Data Output (I/O0-I/O14)
BYTE Switching from byte to word mode
I/O15 (A-1)
Address Input tFHQV
I/O15 Output
BYTE Timings for Write Operations
CE The falling edge of the last WE signal
WE BYTE
tSET (tAS)
tHOLD(tAH)
Note: Refer to the Erase/Program Operations table for tAS and tAH specifications.
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AMIC Technology, Inc.
A29L800 Series
AC Characteristics
Erase and Program Operations (TA=0C to 70C or -45C to +85C) Parameter JEDEC tAVAV tAVWL tWLAX tDVWH tWHDX Std tWC tAS tAH tDS tDH tOES tGHWL tELWL tWHEH tWLWH tWHWL tGHWL tCS tCH tWP tWPH Write Cycle Time (Note 1) Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recover Time Before Write ( OE high to WE low) Min. Min. Min. Min. Min. Min. Min. Min. Min. Min. Min. Byte Word Typ. Typ. Typ. Min. Min Min 35 30 5 s 7 0.7 50 0 90 sec s ns ns 45 35 0 0 0 0 0 35 Description -70 70 0 45 45 Speed -90 90 ns ns ns ns ns ns ns ns ns ns ns Unit
CE Setup Time CE Hold Time
Write Pulse Width Write Pulse Width High Byte Programming Operation (Note 2) Sector Erase Operation (Note 2) VCC Set Up Time (Note 1) Recovery Time from RY/ BY Program/Erase Valid to RY/ BY Delay
tWHWH1
tWHWH1
tWHWH2
tWHWH2 tvcs tRB tBUSY
Notes: 1. Not 100% tested. 2. See the "Erase and Programming Performance" section for more information.
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(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Timing Waveforms for Program Operation
Program Command Sequence (last two cycles)
Read Status Data (last two cycles)
Addresses
555h
PA
~ ~
tWC
tAS
PA
PA
tAH CE tCH OE
tWP WE tCS tDS Data A0h tWPH tDH PD
~ ~
tWHWH1
~ ~
~ ~
~~ ~~
Status
DOUT tRB
tBUSY RY/BY tVCS VCC
Note : 1. PA = program addrss, PD = program data, Dout is the true data at the program address. 2. Illustration shows device in word mode.
~~ ~~
PRELIMINARY
(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Timing Waveforms for Chip/Sector Erase Operation
Erase Command Sequence (last two cycles)
Read Status Data
Addresses
2AAh
SA 555h for chip erase
~ ~
VA
tWC
tAS VA
tAH
CE
OE tCH tWP WE tCS tDS Data 55h tDH 30h 10h for chip erase tWPH
~ ~
tWHWH2
~ ~
~~ ~~
In Progress
~ ~
Complete tRB
tBUSY RY/BY tVCS VCC
Note : 1. SA = Sector Address (for Sector Erase), VA = Valid Address for reading status data (see "Write Operaion Ststus"). 2. Illustratin shows device in word mode.
~ ~
~ ~
PRELIMINARY
(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Timing Waveforms for Data Polling (During Embedded Algorithms)
tRC Addresses VA tACC CE tCH tCE
~ ~
VA
VA
OE tOEH WE tOH High-Z I/O7 Complement Complement True Valid Data tDF
~ ~
~ ~
~ ~
tOE
~~ ~~
High-Z High-Z tBUSY RY/BY Status Data
~ ~
I/O0 - I/O6
Status Data
True
Valid Data
Note : VA = Valid Address. Illustation shows first status cycle after command sequence, last status read cycle, and array data read cycle.
~ ~
PRELIMINARY
(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Timing Waveforms for Toggle Bit (During Embedded Algorithms)
tRC Addresses VA tACC CE tCH tCE VA
~ ~
VA
VA
tOE
tOEH WE
tDF
tOH
I/O6 , I/O2
High-Z tBUSY
Valid Status (first read)
Valid Status (second read)
~ ~
~ ~
Valid Status (stop togging)
~ ~
OE
~~ ~~
Valid Data
RY/BY
Note: VA = Valid Address; not required for I/O6. Illustration shows first two status cycle after command sequence, last status read cycle, and array data read cycle.
~ ~
PRELIMINARY
(September, 2002, Version 0.2)
32
AMIC Technology, Inc.
A29L800 Series
Timing Waveforms for Sector Protect/Unprotect
VID
RESET
VIH
SA, A6, A1, A0
Valid* Sector Protect/Unprotect
~ ~
Valid*
Valid*
~ ~
Verify
Data
1us
60h
60h
Sector Protect:150us Sector Unprotect:15ms
~ ~
40h
Status
CE
WE
OE
Note : For sector protect, A6=0, A1=1, A0=0. For sector unprotect, A6=1, A1=1, A0=0
~ ~
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(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Timing Waveforms for I/O2 vs. I/O6
~ ~
~ ~
~ ~
~ ~
WE
Erase
Erase Suspend Read
Erase Suspend Program
Erase Suspend Read
Erase
~ ~
Erase Complete
Enter Embedded Erasing
Erase Suspend
Enter Erase Suspend Program
Erase Resume
~ ~
~ ~
~ ~
~ ~
~ ~
~ ~
I/O6
~ ~
~ ~
I/O2
I/O2 and I/O6 toggle with OE and CE
Note : Both I/O6 and I/O2 toggle with OE or CE. See the text on I/O6 and I/O2 in the section "Write Operation Status" for more information.
AC Characteristics
Erase and Program Operations Alternate CE Controlled Writes (TA=0C to 70C or -45C to +85C) Parameter JEDEC tAVAV tAVEL tELAX tDVEH tEHDX Std tWC tAS tAH tDS tDH tOES tGHEL tWLEL tEHWH tELEH tEHEL tWHWH1 tWHWH2 tGHEL tWS tWH tCP tCPH tWHWH1 tWHWH2 Write Cycle Time (Note 1) Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recover Time Before Write ( OE High to WE Low) Min. Min. Min. Min. Min. Min. Min. Min. Min. Min. Min. Byte Word Typ. Typ. Typ. 35 30 5 7 0.7 sec 45 35 0 0 0 0 0 35 Description -70 70 0 45 45 Speed -90 90 ns ns ns ns ns ns ns ns ns ns ns s Unit
WE Setup Time WE Hold Time CE Pulse Width CE Pulse Width High
Programming Operation (Note 2) Sector Erase Operation (Note 2)
Notes: 3. Not 100% tested. 4. See the "Erase and Programming Performance" section for more information.
PRELIMINARY
(September, 2002, Version 0.2)
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AMIC Technology, Inc.
~ ~
~ ~
A29L800 Series
Timing Waveforms for Alternate CE Controlled Write Operation
555 for program 2AA for erase PA for program SA for sector erase 555 for chip erase
Data Polling
~ ~
Addresses tWC tWH WE OE tAS
PA
CE tWS tDS
tCPH
tBUSY
tDH Data tRH
~ ~
~ ~
tCP
tWHWH1 or 2
~ ~
~ ~
tAH
~ ~
I/O7
DOUT
A0 for program 55 for erase
RESET
RY/BY
Note : 1. PA = Program Address, PD = Program Data, SA = Sector Address, I/O 7 = Complement of Data Input, DOUT = Array Data. 2. Figure indicates the last two bus cycles of the command sequence.
Erase and Programming Performance
Parameter Sector Erase Time Chip Erase Time Byte Programming Time Word Programming Time Chip Programming Time (Note 3) Byte Mode Word Mode Typ. (Note 1) 1.0 35 35 12 11 7.2 Max. (Note 2) 8 300 500 33 21.6 Unit sec sec s s sec sec Excludes system-level overhead (Note 5) Comments Excludes 00h programming prior to erasure
Notes: 1. Typical program and erase times assume the following conditions: 25C, 3.0V VCC, 10,000 cycles. Additionally, programming typically assumes checkerboard pattern. 2. Under worst case conditions of 90C, VCC = 2.7V, 100,000 cycles. 3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum byte program time listed. If the maximum byte program time given is exceeded, only then does the device set I/O5 = 1. See the section on I/O5 for further information. 4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure. 5. System-level overhead is the time required to execute the four-bus-cycle command sequence for programming. See Table 5 for further information on command definitions. 6. The device has a guaranteed minimum erase and program cycle endurance of 10,000 cycles.
~ ~
~ ~
PD for program 30 for sector erase 10 for chip erase
PRELIMINARY
(September, 2002, Version 0.2)
35
AMIC Technology, Inc.
A29L800 Series
Latch-up Characteristics
Description Input Voltage with respect to VSS on all I/O pins VCC Current Input voltage with respect to VSS on all pins except I/O pins (including A9, OE and RESET) Includes all pins except VCC. Test conditions: VCC = 5.0V, one pin at time. Min. -1.0V -100 mA -1.0V Max. VCC+1.0V +100 mA 12.5V
TSOP and SOP Pin Capacitance
Parameter Symbol CIN COUT CIN2 Parameter Description Input Capacitance Output Capacitance Control Pin Capacitance Test Setup VIN=0 VOUT=0 VIN=0 Typ. 6 8.5 7.5 Max. 7.5 12 9 Unit pF pF pF
Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25C, f = 1.0MHz
Data Retention
Parameter Minimum Pattern Data Retention Time 125C 20 Years Test Conditions 150C Min 10 Unit Years
PRELIMINARY
(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Test Conditions
Test Specifications Test Condition Output Load Output Load Capacitance, CL(including jig capacitance) Input Rise and Fall Times Input Pulse Levels Input timing measurement reference levels Output timing measurement reference levels 30 5 0.0 - 3.0 1.5 1.5 -70 -90 1 TTL gate 100 5 0.0 - 3.0 1.5 1.5 pF ns V V V Unit
Test Setup
3.3 V
2.7 K Device Under Test
CL
6.2 K
Diodes = IN3064 or Equivalent
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(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Ordering Information Top Boot Sector Flash
Part No. Access Time (ns) Active Read Current Typ. (mA) Program/Erase Current Typ. (mA) Standby Current Typ. (A) Package
A29L800TM-70 A29L800TV-70 A29L800TG-70 A29L800TM-90 A29L800TV-90 A29L800TV-90U A29L800TG-90 A29L800TG-90U 90 9 20 0.2 70 9 20 0.2
44Pin SOP 48Pin TSOP 48-ball TFBGA 44Pin SOP 48Pin TSOP 48Pin TSOP 48-ball TFBGA 48-ball TFBGA
Bottom Boot Sector Flash
Part No. Access Time (ns) Active Read Current Typ. (mA) Program/Erase Current Typ. (mA) Standby Current Typ. (A) Package
A29L800UM-70 A29L800UV-70 A29L800UG-70 A29L800UM-90 A29L800UV-90 A29L800UV-90U A29L800UG-90 A29L800UG-90U 90 9 20 0.2 70 9 20 0.2
44Pin SOP 48Pin TSOP 48-ball TFBGA 44Pin SOP 48Pin TSOP 48Pin TSOP 48-ball TFBGA 48-ball TFBGA
PRELIMINARY
(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Package Information SOP 44L Outline Dimensions
23
unit: inches/mm
44
HE
E
Gauge Plane
0.010" 1 b 22 L
Detail F
D C A2 Seating Plane D S y
e
A1
A
L1 See Detail F
Symbol A A1 A2 b C D E e HE L L1 S y
Dimensions in inches Min 0.004 0.103 0.013 0.007 0.490 0.620 0.024 0 Nom 0.106 0.016 0.008 1.122 0.496 0.050 0.631 0.032 0.0675 Max 0.118 0.109 0.020 0.010 1.130 0.500 0.643 0.040 0.045 0.004 8
Dimensions in mm Min 0.10 2.62 0.33 0.18 12.45 15.75 0.61 0 Nom 2.69 0.40 0.20 28.50 12.60 1.27 16.03 0.80 1.71 Max 3.00 2.77 0.50 0.25 28.70 12.70 16.33 1.02 1.14 0.10 8
Notes: 1. The maximum value of dimension D includes end flash. 2. Dimension E does not include resin fins. 3. Dimension S includes end flash.
PRELIMINARY
(September, 2002, Version 0.2)
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AMIC Technology, Inc.
A29L800 Series
Package Information TSOP 48L (Type I) Outline Dimensions
unit: inches/mm
D D1 1 48 A2 A E 25 c 0.25 L Dimensions in inches Min 0.002 0.037 0.007 0.004 0.779 0.720 0.016 0 Nom 0.039 0.009 0.787 0.724 0.472 0.020 BASIC 0.020 0.011 Typ. 0.004 8 0 0.024 0.40 Max 0.047 0.006 0.042 0.011 0.008 0.795 0.728 0.476 Dimensions in mm Min 0.05 0.94 0.18 0.12 19.80 18.30 Nom 1.00 0.22 20.00 18.40 12.00 0.50 BASIC 0.50 0.28 Typ. 0.10 8 0.60 Max 1.20 0.15 1.06 0.27 0.20 20.20 18.50 12.10
24
Detail "A"
Detail "A"
Symbol
A A1 A2 b c D D1 E e L S y
Notes: 1. The maximum value of dimension D includes end flash. 2. Dimension E does not include resin fins. 3. Dimension S includes end flash.
PRELIMINARY
(September, 2002, Version 0.2)
40
AMIC Technology, Inc.
S
e
b
y D
A1
A29L800 Series
Package Information 48LD CSP (6 x 8 mm) Outline Dimensions
(48TFBGA) unit: mm
TOP VIEW
BOTTOM VIEW
b
H G F E D C B A
H G F E D C B A
e E1 e D1 D
123456 Ball*A1 CORNER
SIDE VIEW
C 0.10 C
SEATING PLANE A1
Symbol A A1 b D D1 e E E1
A
Dimensions in mm Min. 0.20 0.30 5.90 Nom. Max. 1.20 0.30 0.40 6.10 8.10 0.25 6.00 4.00 BSC 0.80 7.90 8.00 5.60 BSC
PRELIMINARY
(September, 2002, Version 0.2)
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AMIC Technology, Inc.
E


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